NIKON BW-S505

  • Product Overview

    Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to suit a wide range of measurement applications.


    Model Brochure (2.2 MB)

  • About Company
    Nikon Metrology, Inc.

    Nikon Metrology, Inc. offers the most complete metrology product portfolio, including Coordinate Measuring Machines, Optical CMMs, 3D laser scanners, X-ray and Computed Tomography inspection systems, Large-Scale measuring machines, indoor GPS for tracking and positioning, metrology software and state-of-the-art vision measuring instruments featuring optical and mechanical 3D metrology solutions. These innovative metrology solutions respond to the advanced inspection requirements of manufacturers active in aerospace, electronics, automotive, medical, consumer and other industries.


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