The ECLIPSE MA100/MA100L is a compact-size inverted microscope. It was developed for brightfield observation and simple polarizing observation. Thanks to its compact, durable design and simple operation in addition to its high-contrast observation and image capture, it is excellent for metallographic and electronic components as well as use at production sites in the materials fields and quality control departments.
Nikon Metrology, Inc. offers the most complete metrology product portfolio, including Coordinate Measuring Machines, Optical CMMs, 3D laser scanners, X-ray and Computed Tomography inspection systems, Large-Scale measuring machines, indoor GPS for tracking and positioning, metrology software and state-of-the-art vision measuring instruments featuring optical and mechanical 3D metrology solutions. These innovative metrology solutions respond to the advanced inspection requirements of manufacturers active in aerospace, electronics, automotive, medical, consumer and other industries.