NIKON XT V 160 NF

Model
XT V 160 NF
Brand
Control
CNC
  • Specs
    Control
    CNC
  • Product Overview

    XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications. Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, this industry-leading inspection system offers unrivalled feature recognition compared to any product available on the market today. As such, the XT V 160 NF is indispensable for any electronics development and production environment.


    Model Brochure (686 KB)

  • About Company
    Nikon Metrology, Inc.

    Nikon Metrology, Inc. offers the most complete metrology product portfolio, including Coordinate Measuring Machines, Optical CMMs, 3D laser scanners, X-ray and Computed Tomography inspection systems, Large-Scale measuring machines, indoor GPS for tracking and positioning, metrology software and state-of-the-art vision measuring instruments featuring optical and mechanical 3D metrology solutions. These innovative metrology solutions respond to the advanced inspection requirements of manufacturers active in aerospace, electronics, automotive, medical, consumer and other industries.


Looking to Purchase a New NIKON XT V 160 NF?

Distributors and Service & Repair Shops