FISCHERSCOPE X-RAY XDV®
- 產品概述
Features
Hands-free operation, fully automated measurement process under well-defined constant metrology conditions
Industry-leading polycapillary optics for microspot measurement on structures as small as 10 µm
Very high detector sensitivity and resolution provide precise results
Automatic recognition of measurement structures and shift-compensation of measurement spot
Easy and intuitive system software
Service and maintenance friendly design
Designed to work under clean room conditions
Automated and manual measurements possible with the same instrumentTypical fields of application
Layer thickness and compositional analysis
Under-bump metallization (UBM) down to the nm scale
C4 solder bumps and smaller
Lead-free solder caps on copper pillars
Ultra small landing pads and other advanced 2.5D/3D packaging solutions - 關於公司
Fischer is a manufacturer of non-destructive coating thickness measurement, material testing, nanoindentation and material analysis instrumentation including calibration and certification. Measurement methods available from Fischer include X-Ray fluorescence, beta backscatter, magnetic induction, eddy current, and coulometric measurement principles that are incorporated into hand-held and/or bench top models.
經銷商 和 維修及服務門店
- 經銷商1Helmut Fischer, S. de R.L. de C.V.
Anillo Vial II Junípero Serra No. 2450, Interior 201
Pabellón Corporativo, Valle de Juriquilla II
Querétaro, Queretaro de Arteaga 76230
墨西哥 - 維修及服務門店1