Nikon's Eclipse polarizing microscopes are renowned for their abilitiy to produce brighter, clearer, and higher contrast images. The LV100N POL, available in diascopic and episcopic microscope illumination types, continues this tradition and offers a completely reengineered base for even easier operation. The newly developed high-intensity 50W halogen light source is brighter than a conventional 100W halogen lamp. Low power consumption means less heat generation, thereby reducing the chance of heat-induced focus drift.
Nikon Metrology, Inc. offers the most complete metrology product portfolio, including Coordinate Measuring Machines, Optical CMMs, 3D laser scanners, X-ray and Computed Tomography inspection systems, Large-Scale measuring machines, indoor GPS for tracking and positioning, metrology software and state-of-the-art vision measuring instruments featuring optical and mechanical 3D metrology solutions. These innovative metrology solutions respond to the advanced inspection requirements of manufacturers active in aerospace, electronics, automotive, medical, consumer and other industries.