The Eclipse MA200 is an inverted materials microscope with an innovative design that has been optimized for digital imaging and ergonomic efficiency. The MA200 uses integrated intelligence to automatically combine captured images with data on their observation settings for more comprehensive documentation. Additionally, its new and unique box design allows easy access to the sample on the stage and nosepiece, while making the footprint size one third of the conventional model.
Nikon Metrology, Inc. offers the most complete metrology product portfolio, including Coordinate Measuring Machines, Optical CMMs, 3D laser scanners, X-ray and Computed Tomography inspection systems, Large-Scale measuring machines, indoor GPS for tracking and positioning, metrology software and state-of-the-art vision measuring instruments featuring optical and mechanical 3D metrology solutions. These innovative metrology solutions respond to the advanced inspection requirements of manufacturers active in aerospace, electronics, automotive, medical, consumer and other industries.